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How Low Do You Go? Webinar Recording



Course Description:
Exposure monitoring is increasingly being required at lower and lower levels; examples include beryllium, silica, and carbon nanotubes. These examples are used as case studies for developing monitoring strategies at microgram levels or below. For beryllium, pending regulatory changes with both OSHA and the Department of Energy will have an impact on exposure assessment strategies used in the field and may demand significant adjustments. For example, typical laboratory analysis techniques may not be sensitive enough for short-term air samples. Data evaluation may require tailored statistical methods to properly determine whether very low exposure and surface contamination limits are being met. The changes may also affect requirements for personal protective equipment, workplace housekeeping, and how sampling results are used to implement these requirements. The seven-step Data Quality Objective process provides a logical and recognized framework for planning exposure assessment risk management decision strategies. This webinar will provide a forum on managing ultra-low level exposure monitoring issues.

Learning Objectives:
Upon completion, participants will be able to:

  • Explain how trace-level occupational exposure limits can impact exposure assessment strategies, sampling, and analysis requirements
  • Discuss the Data Quality Objectives framework for risk management decision-making
  • Detail proposed new requirements for worker protection
  • Apply strategies for other ultra-trace contaminants of concern

Contact Hours:
2

Presentation Date:
02/24/2016

Presenters:
Steven Jahn, CIH
Michael Brisson, M.S., PMP
Rosa Key-Schwartz, Ph.D.
Martin Harper, Ph.D., CIH
Laura Hodson